EM TXP Sample Targeting Systems
Leica EM TXP Target Preparation for Electron Microscopy A versatile target preparation device for microscopy. Combining milling, sawing, grinding, and polishing capabilities with an integrated stereomicroscope, makes the EM TXP […]
Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis
Affordable EBSD (electron Backscatter Diffraction) for Material Analysis EBSD is a powerful analytical technique used to examine the crystallographic structure of materials. The Only Small-footprint SEM with EBSD Capabilities Experience […]
Sputter Coating Systems
Coating Systems For Electron Microscopy Electron microscopy coating systems deposit thin, conductive layers (e.g., gold, platinum, carbon) onto samples, preventing charging artifacts and enhancing contrast in SEM and TEM imaging. […]
Buehler Vibratory Polisher
Buehler Vibratory Polisher The Buehler VibroMet 2 vibratory polisher, with a large, 12in [305mm] working surface for multiple samples, is designed to prepare high-quality polished surfaces for a wide variety […]