Visoria M/P Materials Microscope

Focused Ion Beam SEM (FIB-SEM)

Full Size Tungsten SEM

Full Size Field Emission SEM

EM TXP Sample Targeting Systems

Automated Materials Compound Microscopes Leica DM4 M/P & DM6 M/P

Materials Compound Microscope Leica DM2700 M

Ergonomic Stereo Microscopes

Hardness Testing Vickers/Knoop & Brinell

Hardness Testing Rockwell, Universal

Sensofar S wide Surface Metrology

Sensofar S neox Grand Format Product

Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis

Leica K Series of Cameras

Flexacam C5, I5, I5 Integrated

Sputter Coating Systems

Leica M205 Research Grade Ergonomic Stereo Microscopes

Sensofar S neox

Sensofar S lynx 2

Buehler Vibratory Polisher