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Blogs: Latest News, Updates, Tech Notes
Latest
SEM
Sample Prep
Metrology
Microscopy
Education
Leica
JH
What Happens When Elves Discover Surface Metrology?
December 16, 2025
2025 Equipment Tax Benefits to Consider
October 14, 2025
Reviving Legacy AFMs: How to Unlock New Capabilities
September 17, 2025
Automotive Paint Layer Analysis with Microscopy & EDS | JH Technologies
September 8, 2025
What Is EBSD? A Guide to Electron Backscatter Diffraction in SEM
August 26, 2025
What is Ion Milling?
August 26, 2025
EBSD Analysis and SEM Platform Considerations
August 11, 2025
SEM Images Gallery
August 6, 2025
Multi-Technique Characterization of Solder Balls
August 6, 2025
Precision Solder ball Analysis Using Ion Beam Polishing and SEM
July 1, 2025
Tariff Policy Simplified: Stability, Transparency, and Trust
April 15, 2025
Demonstration Equipment: Beating The Tariff Trap
April 15, 2025
The Case of the Missing SEMs: A Story of Quick Thinking, Teamwork & Tech Recovery
April 15, 2025
JH Technologies Partners with Xavis to Deliver Advanced Inspection Solutions to North America
January 16, 2025
New JH Technologies Partnership Focuses on Scanning Electron Microscopes
January 9, 2025
Lithium Battery Sample Preparation
May 16, 2024
What is the best method to prepare a sample for EBSD? [Application Note]
May 16, 2024
What is the best way to preserve and transport polished samples?
May 16, 2024
Handling Delicate Samples [Tips ‘n Tricks]
May 16, 2024
Sample Polishing Methods: Diamond Grinding Disks [APPLICATION NOTE]
May 16, 2024
Polishing Soft Materials: What is the Best Way?
May 16, 2024
Memory Device Cross-Sectioning [Learn from the JHA Team]
May 16, 2024
How To Choose The Correct Mounting Method And Epoxy For Your Samples
May 16, 2024
What does a heat-treated metal look like after sample preparation and etching?
May 16, 2024
Application Note: Proper Maintenance and Cleaning of your Sputter Coater
May 16, 2024
Solutions for Semiconductor Applications
May 16, 2024
Bruker EDS & EBSD
May 16, 2024
Coxem CP-8000
May 16, 2024
Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
Ergonomic Research Stereo Microscopes
Stereo Microscope Lighting​
Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
Digital
SEM & Accessories
Electron Microscopy Sample Preparation
High Resolution SEM
Tabletop & Compact Floor Standing SEM
SEM Detector Software & Hardware
Sample Prep & Cross-sectioning
Hardness Testing
Metrology & 3D Characterization
Cameras, Software & Lenses
Accessories and Lenses
X-Ray Imaging
Analytical Services
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Microtechnology
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Sample Preparation for Electron Microscopy
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