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Microscopes
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Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
Ergonomic Research Stereo Microscopes
Stereo Microscope Lighting​
Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
Digital
SEM & Accessories
Electron Microscopy Sample Preparation
High Resolution SEM
Tabletop & Compact Floor Standing SEM
SEM Detector Software & Hardware
Sample Prep & Cross-sectioning
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Blogs: Latest News, Updates, Tech Notes
Latest
SEM
Sample Prep
Metrology
Microscopy
Education
Leica
JH
What Is EBSD? A Guide to Electron Backscatter Diffraction in SEM
August 26, 2025
What is Ion Milling?
August 26, 2025
EBSD Analysis and SEM Platform Considerations
August 11, 2025
Multi-Technique Characterization of Solder Balls
August 6, 2025
Precision Solder ball Analysis Using Ion Beam Polishing and SEM
July 1, 2025
Tariff Policy Simplified: Stability, Transparency, and Trust
April 15, 2025
Demonstration Equipment: Beating The Tariff Trap
April 15, 2025
The Case of the Missing SEMs: A Story of Quick Thinking, Teamwork & Tech Recovery
April 15, 2025
JH Technologies Partners with Xavis to Deliver Advanced Inspection Solutions to North America
January 16, 2025
New JH Technologies Partnership Focuses on Scanning Electron Microscopes
January 9, 2025
Lithium Battery Sample Preparation
May 16, 2024
What is the best method to prepare a sample for EBSD? [Application Note]
May 16, 2024
What is the best way to preserve and transport polished samples?
May 16, 2024
Handling Delicate Samples [Tips ‘n Tricks]
May 16, 2024
Sample Polishing Methods: Diamond Grinding Disks [APPLICATION NOTE]
May 16, 2024
Polishing Soft Materials: What is the Best Way?
May 16, 2024
Memory Device Cross-Sectioning [Learn from the JHA Team]
May 16, 2024
How To Choose The Correct Mounting Method And Epoxy For Your Samples
May 16, 2024
What does a heat-treated metal look like after sample preparation and etching?
May 16, 2024
Application Note: Proper Maintenance and Cleaning of your Sputter Coater
May 16, 2024
Solutions for Semiconductor Applications
May 16, 2024
Bruker EDS & EBSD
May 16, 2024
Coxem CP-8000
May 16, 2024
JH Technologies Partners With Evactron
May 15, 2024
Student Friendly Scanning Electron Microscopes
May 15, 2024
Overcoming Challenges of Imaging Non-Conductive Samples in Electron Microscopy
May 15, 2024
New S lynx 2 Optical Surface Profiler
May 15, 2024
Buying Guide: Educational Microscopes for Students
May 9, 2024
Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
Ergonomic Research Stereo Microscopes
Stereo Microscope Lighting​
Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
Digital
SEM & Accessories
Electron Microscopy Sample Preparation
High Resolution SEM
Tabletop & Compact Floor Standing SEM
SEM Detector Software & Hardware
Sample Prep & Cross-sectioning
Hardness Testing
Metrology & 3D Characterization
Cameras, Software & Lenses
Accessories and Lenses
X-Ray Imaging
Analytical Services
Applications
Microtechnology
Medical Device
Metallography
Material Science
Education
Semiconductor
Sample Preparation for Electron Microscopy
Forensics
Customer Support
Promotions
About Us
About JH
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Blogs & Updates
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iFUSE
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