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X-ray systems for Semiconductor
X-ray Systems for Electronics
X-Ray systems for large area applications
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Cold and Hot Sample Mounting
EM TXP Sample Targeting Systems
Automated Materials Compound Microscopes Leica DM4 M/P & DM6 M/P
Materials Compound Microscope Leica DM2700 M
Ergonomic Stereo Microscopes
Abrasive Cutters Large Area
Precision Cutters High Volume
Precision Cutters Low Volume
Hardness Testing Vickers/Knoop & Brinell
Hardness Testing Rockwell, Universal
Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis
Leica K Series of Cameras
Flexacam C5, I5, I5 Integrated
Manual Grinder Polisher Ecomet 30
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Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
Ergonomic Research Stereo Microscopes
Stereo Microscope Lighting​
Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
Digital
SEM & Accessories
Electron Microscopy Sample Preparation
High Resolution SEM
Tabletop & Compact Floor Standing SEM
SEM Software & Hardware
Sample Prep & Cross-sectioning
Hardness Testing
Metrology & 3D Characterization
Cameras, Software & Lenses
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Microtechnology
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