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Visoria M/P Materials Microscope
X-ray systems for Semiconductor
X-ray Systems for Electronics
X-Ray systems for large area applications
Focused Ion Beam SEM (FIB-SEM)
Full Size Tungsten SEM
X-Ray systems for Battery Technology
Full Size Field Emission SEM
Cold and Hot Sample Mounting
EM TXP Sample Targeting Systems
Ergonomic Stereo Microscopes
Abrasive Cutters Large Area
Precision Cutters High Volume
Precision Cutters Low Volume
Hardness Testing Vickers/Knoop & Brinell
Hardness Testing Rockwell, Universal
Sensofar S wide Surface Metrology
Sensofar S neox Grand Format Product
Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis
Leica K Series of Cameras
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Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
Ergonomic Research Stereo Microscopes
Stereo Microscope Lighting
Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
Digital
SEM & Accessories
Electron Microscopy Sample Preparation
High Resolution SEM
Tabletop & Compact Floor Standing SEM
SEM Software & Hardware
Sample Prep & Cross-sectioning
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