Focused Ion Beam SEM (FIB-SEM)

Focused Ion Beam SEM (FIB-SEM) The CIQTEK DB550 is an advanced Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) capabilities, offering comprehensive nano-analysis and fabrication in a […]

Full Size Tungsten SEM

Full Size Tungsten SEM The CIQTEK SEM3300 is a next-generation tungsten filament scanning electron microscope that combines in-lens electron detectors with electrostatic and electromagnetic compound objective lenses, enabling low-voltage analysis […]

Full Size Field Emission SEM

Full Size Field Emission SEM The CIQTEK SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope (FESEM) with optimized electron optics that reduce aberrations by 30%, enabling 0.6 nm […]

Sensofar S wide Surface Metrology

Sensofar S wide Surface Metrology The S wide system uses Fringe Projection technology to quickly acquire large-area measurements with high vertical resolution. It includes analysis tools to extract data on […]

Sensofar S neox Grand Format Product

Sensofar S neox Grand Format A high-performance, non-contact 3D optical profiler designed for advanced surface metrology applications of large panels in semiconductor, display, and PCB industries. The S neox Grand […]

Sensofar S neox

Sensofar S neox Automated Surface Profiling Sensofar 3D surface profiling solutions enable precise measurements and comprehensive analysis, essential for scientific research, industrial inspection, and quality control in fields such as […]

Sensofar S lynx 2

Sensofar S lynx 2 Automated Compact Surface Profiling Sensofar ‘s S lynx 2 compact 3D surface profiling system enables precise measurements and comprehensive analysis, in cost effective  small format platform. […]