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Visoria M/P Materials Microscope
X-ray systems for Semiconductor
X-ray Systems for Electronics
X-Ray systems for large area applications
Focused Ion Beam SEM (FIB-SEM)
Full Size Tungsten SEM
X-Ray systems for Battery Technology
Full Size Field Emission SEM
EM TXP Sample Targeting Systems
Fullsize Floor Standing SEM, Coxem CX-200K
Ergonomic Stereo Microscopes
Sensofar S wide Surface Metrology
Sensofar S neox Grand Format Product
Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis
Leica K Series of Cameras
Flexacam C5, I5, I5 Integrated
Sputter Coating Systems
Leica M205 Research Grade Ergonomic Stereo Microscopes
Sensofar S neox
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Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
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Education
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